Burn-in system for electronic component screening/reliability evaluation

Identify initial failure electronic components! A diverse selection including high heat resistance types and space-saving types.

Omura Giken's "Burn-in System" is a system that applies temperature and electrical stress to semiconductor devices and electronic components, helping to identify early failure products. It is possible to manufacture systems with added functions tailored to the needs of device types, processing quantities, applied signals, etc., for screening mass-produced products as well as for reliability evaluation. You can choose from various types suited to usage conditions, such as space-saving types, high-heat device compatible types, and low-temperature test compatible types. 【Features】 ■ For identifying early failure products ■ From screening mass-produced products to reliability evaluation ■ Ability to select products with features tailored to usage conditions *For more details, please refer to the PDF materials or feel free to contact us.

Analysis and prediction systemOther measuring instrumentsOther analytical equipment