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  4. The new model of the flying probe tester will be unveiled for the first time in the country! We will be exhibiting at the 39th NEPCON Japan Electronics Development and Manufacturing Expo.
SEMINAR_EVENT
  • Nov 25, 2024
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Nov 25, 2024

The new model of the flying probe tester will be unveiled for the first time in the country! We will be exhibiting at the 39th NEPCON Japan Electronics Development and Manufacturing Expo.

タカヤ タカヤ
We would like to express our sincere gratitude for your continued support. Takaya Corporation will be exhibiting at the "39th Internepcon Japan Electronics Manufacturing and Packaging Exhibition" to be held at Tokyo Big Sight from January 22 (Wednesday) to January 24 (Friday), 2025. Exhibited Products Industrial Equipment Division ○ Flying Probe Tester ・New model "APT-2600FD-A" *First exhibition in Japan RF Division / Solutions Division ○ RFID Products ・RFID × IoT Platform ・RFID Continuous Monitoring Middleware ・RFID Outgoing Management System ・RFID Inbound/Outbound Plugin Package We look forward to your visit to our booth.
Date and time Wednesday, Jan 22, 2025 ~ Friday, Jan 24, 2025
10:00 AM ~ 05:00 PM
Capital Facility Name: Tokyo Big Sight Address: 3-11-1 Ariake, Koto City, Tokyo 135-0063 Takaya Co., Ltd. Booth: East Hall 2, E17-2
Entry fee Free
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Flying Probe Tester APT-2400F / 2600FD

[39th NePCON Japan Domestic Debut] Supports inspection of high-density printed circuit boards with industry-leading accuracy! New model of flying probe tester.

Takaya Corporation announces the new model of its flying probe tester, "APT-2400F/APT-2600FD series," which reliably detects various defects in printed circuit boards through ultra-fast inspection. Equipped with cutting-edge inspection technology that can check fine component placements and connections with high precision, it ensures that even minor defects and risks are not overlooked, strongly supporting product quality improvement. Additionally, thanks to our unique control mechanisms and sensing technology, reliable inspections can be achieved even in fluctuating environments, contributing to quality management by reducing recall risks. Furthermore, the user-friendly interface allows anyone to operate it intuitively, helping to alleviate burdens in workplaces where labor shortages are becoming serious, while still ensuring high inspection accuracy and contributing to increased productivity. *For more details, please download the PDF document or feel free to contact us.*

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Flying Probe Tester APT-2400F

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!

The APT-2400F boasts industry-leading probing accuracy capable of inspecting high-density mounted circuit boards, and through its unique control mechanisms and sensing technology, it achieves highly reliable electrical testing in all environments. It is the next-generation flying probe tester. We accept evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch, where you can bring in your circuit boards. We can conduct a series of tests including the creation of inspection programs, testing with actual circuit boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Flying Probe Tester APT-2400F-SL

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototype to mass production!

The APT-2400F-SL is a large model that retains the basic performance of the APT-2400F while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate component heights of 60mm on the top and 120mm on the bottom, and can handle board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch, where you can bring your boards for testing. A complete testing process is possible, including the creation of inspection programs, inspection using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Dual Side Flying Probe Tester APT-2600FD

A new innovation in substrate manufacturing. Achieving improved production efficiency and inspection accuracy!

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototype to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Dual Side Flying Probe Tester APT-2600FD-SL

A new innovation in substrate manufacturing. Achieving improved production efficiency and inspection accuracy!

The APT-2600FD-SL is a large model that maintains the basic performance of the APT-2600FD while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of up to 60mm and board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring your boards for testing. A complete flow of testing is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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RFID × IoT Data Service "RFID Work Performance Collection System"

TAKAYA IoT platform utilizing cloud environment

In recent years, with the promotion of work style reform, there has been an increasing demand for improved productivity and the correction of long working hours, necessitating companies to accurately grasp the actual working hours and tasks of their employees. However, the accuracy of data collection remains unclear. Particularly in the manufacturing industry, many cases still rely on handwritten forms, leading to challenges in accurately capturing performance information due to omissions or errors in entries. Against this backdrop, our company has developed an "RFID Work Performance Collection System" that allows performance data to be transmitted simply by placing an RFID tag on an autonomous RFID reader. Since there is no need to record each start and completion of work, workers can naturally and accurately log their working hours without being consciously aware of it. This ease of collecting performance data allows for more time to be allocated to data analysis, enabling effective use of the information for reviewing personnel allocation and understanding and improving the status of each process as part of profit improvement data.

  • Process Control System

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UHF band RFID constant monitoring middleware

Easily achieve constant monitoring with RFID! It enables real-time understanding of the inventory status and movement of managed items.

This is middleware for easily implementing a "constant monitoring RFID system" that automatically acquires the inventory and movement status of managed items. ■ Advanced Event Processing It processes the read IC tag data and databases the "inventory information" and "movement information" necessary for constant monitoring. ■ Easy Data Utilization The collected information is stored in a database, allowing users to easily access the necessary information whenever needed. (Database: PostgreSQL) ■ Centralized Management of Reader/Writers It supports multiple readers and multiple antennas, centrally managing various settings related to the reader/writer. The configuration of the readers and reading settings can also be easily performed from the screen.

  • RFID/IC tags

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RFID Asset Management System

Functions specialized for borrowing and returning operations are templated. IC tags are attached to managed items, enabling borrowing, returning, and inventory checks using RFID.

This is a management system for tracking items using IC tags. It reliably records the history of borrowing and returning items, preventing omissions and errors in ledger entries, and supports the early detection of forgotten returns and losses. Additionally, it enables efficient inventory checks through bulk reading with RFID handheld devices. Common issues that arise in traditional borrowing management tasks include: ♦ Handwriting or Excel input into the ledger The process of entering information into the ledger or Excel during borrowing and returning is cumbersome, leading to discrepancies due to entry errors. ♦ Individual confirmation during inventory checks It is necessary to take items out of boxes or shelves one by one for confirmation, which consumes a significant amount of time for inventory tasks. ♦ Management through ledgers Due to management with paper or Excel ledgers, it is not possible to detect unreturned items or losses early and respond quickly. This system addresses these challenges.

  • Warehouse Management System (WMS)

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RFID Inventory Management Plugin Package

The existing system remains unchanged! You can easily implement inventory inspection for inbound and outbound using RFID.

Attach IC tags to managed items and realize the collection of inbound and outbound inventory data using RFID. This package absorbs the challenges of reader-writer control in building an RFID system, eliminating the need for RFID development on the customer side. It integrates with upper systems via CSV or API, allowing for the introduction of RFID into existing WMS or core systems in a plug-in manner. This is a simple and easy-to-understand package specifically designed for RFID data collection. **Features** ■ Bulk Reading The bulk reading feature of RFID significantly improves the efficiency of inbound and outbound inventory operations. Additionally, operations can be tailored to the customer's environment and business needs, whether using handheld devices or gates. ■ IC Tag Issuance The package includes an IC tag issuance function using RFID-compatible label printers. Even if IC tags cannot be attached at the manufacturing (sourcing) stage, they can be issued in-house. ■ Integration with Upper Systems It integrates with upper systems via API or CSV. Existing systems can remain unchanged while introducing the RFID system in a plug-in manner.

  • Warehouse Management System (WMS)

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Related catalog(13)

[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

TECHNICAL
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Dual Side Flying Probe Tester APT-2600FD

Dual Side Flying Probe Tester APT-2600FD

PRODUCT
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Flying Probe Tester APT-2400F

Flying Probe Tester APT-2400F

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RFID × IoT Data Service "RFID Work Performance Collection System"

RFID × IoT Data Service "RFID Work Performance Collection System"

CATALOG
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UHF band shelf antenna & constant monitoring middleware

UHF band shelf antenna & constant monitoring middleware

TECHNICAL
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RFID Outgoing Management System

RFID Outgoing Management System

PRODUCT
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RFID Inventory Management Plugin Package

RFID Inventory Management Plugin Package

TECHNICAL
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Utilization of ODB++ format

Utilization of ODB++ format

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Hybrid inspection system combining JTAG testing and flying probe testers.

Hybrid inspection system combining JTAG testing and flying probe testers.

TECHNICAL
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Company Profile Takaya Corporation

Company Profile Takaya Corporation

COMPANY
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Company Profile TAKAYA Corporation

Company Profile TAKAYA Corporation

COMPANY
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Flying Probe Tester TAKAYA APT-2400F Series

Flying Probe Tester TAKAYA APT-2400F Series

PRODUCT
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Dual-side Flying Probe Tester TAKAYA APT-2600FD Series

Dual-side Flying Probe Tester TAKAYA APT-2600FD Series

PRODUCT
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Information and Communications
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Exhibiting at FIT Osaka (Financial International Information Technology Exhibition) 2026, where you can understand the DX trends of regional financial institutions.

  • NEW
  • SEMINAR_EVENT

We will be exhibiting at the "Financial International Information Technology Exhibition" FIT Osaka 2026, which will be held at Grand Front Osaka on September 3 (Thursday) and September 4 (Friday). We will introduce the features of our human resources information system "Fellowship," which includes various functions useful for HR department operations, such as personnel management, payroll, and employment.

Aug 27, 2026

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MIDAS Construction Field WEB Technical Course: Effects of Proximity and Co-location of Shield Tunnels and Design Consideration Methods [Construction / FEM Sequential Excavation Analysis]

  • NEW
  • SEMINAR_EVENT

Our company will invite professors who are active at the forefront of university research to hold a web technology course in the construction field. This time, as a follow-up to "The Effects and Design Considerations of Shield Tunnels in Proximity and Adjacent Situations - Part 1," which was published in July, we will have a lecture by Professor Noriyuki Horiuchi from Kokushikan University. In "Part 1," we explained the phenomena of the effects caused by proximity and adjacent shield tunnels, using examples of left-right adjacency and passing beneath existing tunnels, as well as the basic concepts of numerical evaluation. In "Part 2," we will focus on the vertical adjacency of large-section shields. We will introduce analytical methods for numerically evaluating the impact on existing tunnels, surrounding ground, and existing underground structures, using actual site measurement data and FEM sequential excavation analysis, specifically in cases where large-section shields are constructed above or below existing tunnels. We will also discuss methods for predictive analysis, design, and construction considerations. This course will be beneficial for those studying for the "Professional Engineer Examination," so please take this opportunity to participate. Additionally, this course is a CPD accredited program by the Japan Society of Civil Engineers (planned), and you can also participate as part of engineer education. We sincerely look forward to your participation.

Aug 27, 2026

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Achieving Results on a Low Budget! Webinar on Recruitment Strategies for Small and Medium Enterprises

  • NEW
  • SEMINAR_EVENT

In this webinar, we will clearly explain effective operational methods based on media characteristics, timing for posting, and points for improvement after publication. It is not only important to "collect applications" in recruitment. To prevent mismatches and early turnover after hiring, it is crucial to review the entire recruitment process, including how job information is conveyed and what to confirm during the selection process. Therefore, we will also introduce how to design the recruitment process to prevent discrepancies in understanding with job seekers and to enhance retention rates. Additionally, in small and medium-sized enterprises with few recruitment personnel, the workload involved in creating job postings, responding to applicants, and measuring effectiveness can become a significant burden. We will also explain how to systematize and streamline media operations to make recruitment tasks more efficient, allowing continuous recruitment activities even with limited personnel. Finally, based on the content introduced this time, we will organize and convey specific improvement actions that can be implemented starting tomorrow. Even companies that find it difficult to increase their recruitment budget may have the potential to enhance recruitment outcomes by reviewing their choice of job media, job postings, operational methods, and recruitment processes.

Aug 25, 2026

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Notice of Participation in the 3rd Field DX EXPO [Autumn]

  • NEW
  • SEMINAR_EVENT

Our company will be exhibiting at the on-site DX EXPO【Autumn】held at Makuhari Messe, in collaboration with Japan Comsys Corporation, TOSYS Corporation, NDS Corporation, and Tomei Communication Industry Corporation, as part of the Comsys Group. This exhibition is held within the "Japan DX & AX Week" and is a specialized exhibition where the latest solutions supporting digital transformation (DX) such as image processing AI, remote monitoring, and robotics gather for those working in various fields such as construction sites and factories. We will also be introducing various AI-powered solutions from our company. Exhibited Products: - Collaborative solutions from various companies (AIJO Site Monitor 'Bear Detection Solution') - AI rebar shape measurement system 'AIJO Rebar King -AIJO HiKing-' - AI monitoring solution 'AIJO Site Monitor' - Safety gear inspection before work 'AIJO Safety' - Product appearance inspection solution for manufacturing industry 'AIJO Check AItem' - Automated drone inspection service for solar power plants 'AIJO Check Solar' and more.

Aug 25, 2026

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Utilization of the experimental design features of the statistical analysis software JMP in the manufacturing industry.

  • NEW
  • SEMINAR_EVENT

JMP is software that not only excels in statistical analysis and graph creation but also has robust features for experimental design. By utilizing experimental design, efficient data collection can be achieved while minimizing time and costs. In this seminar, we will focus on the features of experimental design, specifically the sample size explorer and Bayesian optimization, and demonstrate examples of their application in the manufacturing industry. 【Overview】 First half: Utilization of t-tests in the manufacturing industry and simulation of required data numbers We will explain the overview and examples of t-tests, which are used for various purposes in the manufacturing industry, and present analysis examples using JMP. Additionally, we will introduce a method to simulate the relationship between the required data numbers for t-tests and statistical power using the sample size explorer. Second half: How to utilize JMP Pro Bayesian optimization – Application to simulation experimental data The Bayesian optimization platform is originally designed for experimental data that includes measurement errors, but there is also a strong demand to apply it to simulation experimental data that does not contain errors, such as CAE. In this seminar, we will introduce approaches for utilizing Bayesian optimization with simulation experimental data.

Aug 25, 2026

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