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The "GRIFFIN-III" is a logic tester that, while being low-cost compared to ATEs with equivalent functions, features AC calibration, SCAN functionality, 64MW vector memory, and high-precision DC-PMU, all while achieving a compact, lightweight design and low power consumption. The accompanying software includes a Windows-based user-friendly GUI, allowing for easy creation of test programs without the need for special expertise. Additionally, it comes standard with test program conversion software and software for converting various vector data to HILEVEL format. 【Features】 ■ Low cost ■ Lightweight and compact ■ Eco-friendly design ■ High performance ■ Achieves low power consumption *For more details, please refer to the PDF materials or feel free to contact us.
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Free membership registrationThis product is a test rig developed for the dynamic stiffness of rubber elastic mounts. It enables dynamic testing of rubber elastic mounts up to 3,000Hz, allowing for fast and reliable results in outdoor tests such as in laboratories. Additionally, when combined with the VibControl measurement system and vibration control software from m+p International in Germany, it enables fast and efficient testing. 【Features】 ■ Dynamic stiffness frequency of rubber elastic mounts: 50Hz to 3,000Hz (Max) ■ Preload: 5,000N (Option: 8kN) ■ Closed-loop vibration control: Maximum acceleration 10g (98m/sec²) *For more details, please refer to the PDF document or feel free to contact us.
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Free membership registrationThe Virtek VPS1 projector projects work contours, mounting positions, and machining positions using 2D/3D CAD data with laser lines. This reduces the need for manual measuring, using squares, templates, and resin plates for marking tasks. It can also be used for simple post-assembly mounting and machining inspections. Additionally, with the newly introduced feature "Real-Time Tracking Software 'Active Track'," it can even project onto moving workpieces. This is expected to significantly improve work efficiency, quality, and prevent work omissions.
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