Low cost, high precision, accurate non-destructive testing from 50,000 yen per sample.
From 50,000 yen (excluding tax) / 1 sample
*Sample transportation costs (generally, the transportation costs are borne by the customer)
【Measurement Content】
Defect analysis - Pore analysis
*For other measurement contents, please inquire.
【Delivery Data】
Measurement report + Original report image + Defect statistics table
【CT Scanner Specifications】
Model name: General-purpose Micro/Nano CT System diondo d2
Reflection target X-ray tube: 190-300kV
Transmission target X-ray tube: 160-300kV
Area array detector: 3000 × 3000px, 139μm
Focal distance range: 400-1200mm, adjustable
Maximum effective detection range: Ø520×H650mm
Maximum load capacity: 50kg
diControl software features: DR function, spiral CT, angle-limited scan, high-speed CT, high-speed reconstruction GPU acceleration, beam hardening correction, artifact correction, batch automatic detection, automatic geometry correction, daily detection, status detection, measurement module VDI/VDE 2630
【Inquiries/Estimates】
Email: info@nd-seiko.co.jp
Phone: 0538-84-9600