EddyCus(R)TF lab 2020 series
Manual mapping measurements of sheet resistance are possible using user-friendly software.
The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurately measures the sheet resistance of conductive films at a single point (Ohm/sq) ■ Measures the thickness of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.
- Company:リッチモアインターナショナル 本社
- Price:Other